Former EDA industry expert makes the case for pre-silicon testing using post-silicon tools. What part will IP play? Will design and test languages be a problem? Most engineers typically think of traditional test equipment as stand alone bulky oscilloscopes, digital-voltage-meters, logic analyzers and the like. But the trend over the last several decades has been toward modular test systems based on software. Today, modular boxes are used to perform every test function imaginable, from signal generator, spectrum analyzer, digital data source, to buss monitoring and control. These modules are connected together in a buss oriented backplane, controlled by software on the front-end. Read the complete post on the Chipestimate.com IP-Insider blog.